Abstract Focused ion beam (FIB) is an effective tool for precise nanoscale fabrication.It has recently been employed to tailor defect engineering in functional nanomaterials such as two-dimensional transition metal dichalcogenides (TMDCs), providing desirable properties in TMDC-based optoelectronic devices.However, the damage caused by the FIB irra

Sterile neutrinos coupling only Chemical Components and Biological Effects of Genus Origanum to third-generation fermions are attractive dark matter candidates.In an EFT approach we demonstrate that they can generate the observed relic density without violating constraints from direct and indirect detection.Such an EFT represents a gauged third-gen